雙字元錯誤碼 |
相關物件 |
意義 |
BB |
Bondpad to Bondpad |
Bondpad之間的錯誤 |
BL |
Bondpad to Line |
Bondpad與Line之間的錯誤 |
BS |
Bondpad to Shape |
Bondpad與Shape 之間的錯誤 |
CC |
Package to Package |
Package之間的 Spacing 錯誤 |
CC |
Symbol Soldermask to Symbol |
Soldermask零件防焊層之間的Spacing 錯誤 |
DF |
Differential Pair Length Tolerance |
差動訊號走線的長度誤差過長 |
DF |
Differential Pair Primary Max Separation |
差動訊號走線的主要距離太大 |
DF |
Differential Pair Secondary Max Separation |
差動訊號走線的次要距離太大 |
DF |
Differential Pair Secondary Max Length |
差動訊號走線的次要距離長度過長 |
DI |
Design Constraint Negative Plane Island |
負片孤銅的錯誤 |
ED |
Propagation-Delay |
走線的長度錯誤 |
ED |
Relative-Propagation-Delay |
走線的等長錯誤 |
EL |
Max Exposed Length |
走線在外層(TOP&BOTTOM)的長度過長 |
EP |
Max Net Parallelism Length-Distance Pair |
已超過Net之間的平行長度 |
ES |
Max Stub Length |
走線的分支過長 |
ET |
Electrical Topology |
走線連接方式的錯誤 |
EV |
Max Via Count |
已超過走線使用的VIA的最大數目 |
EX |
Max Crosstalk |
已超過Crosstalk值 |
EX |
Max Peak Crosstalk |
已超過Peak
Crosstalk值 |
HH |
Hold to Hold Spacing |
鑽孔之間的距離太近 |
HW |
Diagonal Wire to Hold Spacing |
斜線與鑽孔之間的距離太近 |
HW |
Hold to Orthogonal Wire Spacing |
鑽孔與垂直/水平線之間的距離太近 |
IM |
Impedance Constraint |
走線的阻抗值錯誤 |
JN |
T Junction Not Allowed |
走線呈T形的錯誤 |
KB |
Route Keepin to Bondpad |
Bondpad在Keepin之外 |
KB |
Route keepout to Bondpad |
Bondpad在keepout之內 |
KB |
Via Keepout to Bondpad |
Bondpad在Via Keepout之內 |
KC |
Package to Place Keepin Spacing |
元件在Place
Keepin之外 |
KC |
Package to Place Keepout Spacing |
元件在Place
Keepout之內 |
KL |
Line to Route Keepin Spacing |
走線在Route
Keepin之外 |
KL |
Line to Route Keepout Spacing |
走線在Route
Keepout之內 |
KS |
Shape to Route Keepin Spacing |
Shape在Route Keepin之外 |
KS |
Shape to Route Keepout Spacing |
Shape在Route Keepout之內 |
KV |
BBVia to Route Keepin Spacing |
BBVia在Route Keepin之外 |
KV |
BBVia to Route Keepout Spacing |
BBVia在Route Keepout之內 |
KV |
BBVia to Via Keepout Spacing |
BBVia在Via Keepout之內 |
KV |
Test Via to Route Keepin Spacing |
Test Via在Route Keepin之外 |
KV |
Test Via to Route Keepout Spacing |
Test Via在Route Keepout之內 |
KV |
Test Via to Via Keepout Spacing |
Test Via在Via Keepout之內 |
KV |
Through Via to Route Keepin Spacing |
Through Via在Route Keepin之外 |
KV |
Through Via to Route Keepout Spacing |
Through Via在Route Keepout之內 |
KV |
Through Via to Via Keepout Spacing |
Through Via在Via Keepout之內 |
LB |
Min Self Crossing Loopback Length |
無 |
LL |
Line to Line Spacing |
走線之間太近 |
LS |
Line to Shape Spacing |
走線與Shape 太近 |
LW |
Min Line Width |
走線的寬度太細 |
LW |
Min Neck Width |
走線變細的寬度太細 |
MA |
Soldermask Alignment Error Pad |
Soldermask Tolerance太小 |
MC |
Pin/Via Soldermask to Symbol Soldermask |
Pad與Symbol Soldermask之間的錯誤 |
MM |
Pin/Via Soldermask to Pin/Via Soldermask |
Pad Soldermask之間的錯誤 |
PB |
Pin to Bondpad |
Pin與Bondpad之間的錯誤 |
PL |
Line to SMD Pin Spacing |
走線與SMD元件腳太近 |
PL |
Line to Test Pin Spacing |
走線與Test元件腳太近 |
PL |
Line to Through Pin Spacing |
走線與Through元件腳太近 |
PP |
SMD Pin to SMD Pin Spacing |
SMD元件腳與SMD元件腳太近 |
PP |
SMD Pin to Test Pin Spacing |
SMD元件腳與Test元件腳太近 |
PP |
Test Pin to Test Pin Spacing |
Test元件腳與Test元件腳太近 |
PP |
Test Pin to Through Pin Spacing |
Test元件腳與Through元件腳太近 |
PP |
Through Pin to SMD Pin Spacing |
Through元件腳與SMD元件腳太近 |
PP |
Through Pin to Through Pin Spacing |
Through元件腳與Through元件腳太近 |
PS |
Shape to SMD Pin Spacing |
Shape與SMD元件腳太近 |
PS |
Shape to Test Pin Spacing |
Shape與Test元件腳太近 |
PS |
Through Pin to Shape Spacing |
Through元件腳與Shape太近 |
PV |
BBVia to SMD Pin Spacing |
BBVia與SMD元件腳太近 |
PV |
BBVia to Test Pin Spacing |
BBVia與Test元件腳太近 |
PV |
BBVia to Through Pin Spacing |
BBVia 與Through元件腳太近 |
PV |
SMD Pin to Test Via Spacing |
SMD Pin與Test Via太近 |
PV |
SMD Pin to Through Via Spacing |
SMD Pin與Through Via太近 |
PV |
Test Pin to Test Via Spacing |
Test Pin與Test Via太近 |
PV |
Test Pin to Through Via Spacing |
Test Pin與Through Via太近 |
PV |
Test Via to Through Pin Spacing |
Test Via與Through Pin太近 |
PV |
Through Pin to Through Via Spacing |
Through Pin與Through Via太近 |
RC |
Package to Hard Room |
元件在其他的Room之內 |
RE |
Min Length Route End Segment at 135Degree |
無 |
RE |
Min Length Route End Segment at 45/90Degree |
無 |
SB |
135Degree Turn to Adjacent Crossing Distance |
無 |
SB |
90Degree Turn to Adjacent Crossing Distance |
無 |
SL |
Min Length Wire Segment |
無 |
SL |
Min Length Single Segment Wire |
無 |
SN |
Allow on Etch Subclass |
允許在走線層上 |
SO |
Segment Orientaion |
無 |
BB |
Bondpad to Bondpad |
Bondpad之間的錯誤 |
SS |
Shape to Shape |
Shape之間的錯誤 |
TA |
Max Turn Angle |
無 |
VB |
Via to Bondpad |
Via 與Bondpad之間的錯誤 |
VG |
Max BB Via Stagger Distance |
同一段線的BB
Via之間的距離太長 |
VG |
Min BB Via Gap |
BB Via之間太近 |
VG |
Min BB Via Stagger Distance |
同一段線的BB
Via之間的距離太近 |
VG |
Pad/Pad Direct Connect |
Pad 在另一個Pad 之上 |
VL |
BB Via to Line Spacing |
BB Via與走線太近 |
VL |
Line to Through Via Spacing |
走線與Through Via太近 |
VL |
Line to Test Via Spacing |
走線與Test Via太近 |
VS |
BB Via to Shape Spacing |
BB Via與Shape太近 |
VS |
Shape to Test Via Spacing |
Shape 與Test Via太近 |
VS |
Shape to Through Via Spacing |
Shape與Through Via太近 |
VV |
BB Via to BB Via Spacing |
BB Via之間太近 |
VV |
BB Via to Test Via Spacing |
BB Via與Test Via太近 |
VV |
BB Via to Through Via Spacing |
BB Via與Through Via太近 |
VV |
Test Via to Test Via Spacing |
Test Via之間太近 |
VV |
Test Via to Through Via Spacing |
Test Via與Through Via太近 |
VV |
Through Via to Through Via Spacing |
Through Via之間太近 |
WA |
Min Bonding Wire Length |
Bonding Wire 長度太短 |
WE |
Min End Segment Length |
無 |
WE |
Min Length Wire End Segment at 135Degree |
無 |
WE |
Min Length Wire End Segment at 45/90Degree |
無 |
WI |
Max Bonding Wire Length |
Bonding Wire 長度太長 |
WW |
Diagonal Wire to Diagonal Wire Spacing |
斜線之間太近 |
WW |
Diagonal Wire to Orthogonal Wire Spacing |
斜線與垂直/水平線之間的距離太近 |
WW |
Orthogonal Wire to Orthogonal Wire Spacing |
垂直/水平線之間的距離太近 |
WX |
Max Number of Crossing |
無 |
WX |
Min Distance between Crossing |
無 |
XB |
135 Degree Turn to Adjacent Crossing Distance |
無 |
XB |
90 Degree Turn to Adjacent Crossing Distance |
無 |
XD |
Externally Determined Violation |
無 |
XS |
Crossing to Adjacent Segment Distances |
無 |
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